[fitsbits] exposure time - resolution

[Steve Allen]

On Mon 2000-06-05T12:01:36 -0700, Tom Kuiper hath writ:
> looking for a keyword that apparently doesn't exist, but could be named
> something like CRESLx, which would be the full width at half maximum
> of the instrumetal response along the coordinate x.

What meaning should be used if the resolution of the instrument is
much smaller than one pixel; i.e., the pixels are huge?
This could be relevant in situations of low S/N where binning of
a CCD is done on the chip during readout.

In such a case the resolution in the FITS file has a bin-like profile
that doesn't match the Gaussian-like FWHM notion.

In the more general case of binning during data processing, how
should such a keyword be redefined if the binning is done
	by averaging pixels?
	by sampling pixels?

--
Steve Allen          UCO/Lick Observatory       Santa Cruz, CA 95064
sla at ucolick.org      Voice: +1 831 459 3046     http://www.ucolick.org/~sla
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